Once you have an individual circuit it is time to test it. This machine is set up to apply voltage using a power source to your circuit. It holds the wafer and has a microscope attached to a computer for visual inspection during testing.
A Mechanical probe station is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes manipulators which allow the precise positioning of thin needles on the surface of a semiconductor device. If the device is being electrically stimulated, the signal is acquired by the mechanical probe and is displayed on an oscilloscope. The mechanical probe station is often used in the failure analysis of semiconductor devices.