Sem

  • Magnification x 10 to 650,000
  • Resolution 1.2 nm at (30kV)
  • 3.0 nm (at 1.0 kV)
  • BEI detector (for backscattered electron image)
  • EDS (X-ray spectrometer) by EDAX
  • e-beam lithography by JC Nabity

Go to the Manuals page to download the SEM Basic Operating Instructions and JEOL 7000 Specimen Exchange Instructions

Note: Page is password protected. Users need to contact center staff to obtain it.

Resources for Free Imaging Analysis/Processing Software:

http://rsbweb.nih.gov/ij/
http://www.nist.gov/lispix/imlab/prelim/dnld.html
http://www.irfanview.com/
http://www.liv.ac.uk/~sdb/ImageSXM/
http://knol.google.com/k/spm-software#
http://pacific.mpi-cbg.de/wiki/index.php/Fiji
http://www.macbiophotonics.ca/imagej/
http://www.endrov.net/index.php?title=Main_Page
http://www.cellprofiler.org/
http://www.mediacy.com/index.aspx?page=IPP

If you have additional suggestions, please send an email to fxwatanabe@ualr.edu


(C) University of Arkansas at Little Rock