• Magnification x 10 to 650,000
  • Resolution 1.2 nm at (30kV)
  • 3.0 nm (at 1.0 kV)
  • BEI detector (for backscattered electron image)
  • EDS (X-ray spectrometer) by EDAX
  • e-beam lithography by JC Nabity

Go to the Manuals page to download the SEM Basic Operating Instructions and JEOL 7000 Specimen Exchange Instructions

Note: Page is password protected. Users need to contact center staff to obtain it.

Resources for Free Imaging Analysis/Processing Software:

If you have additional suggestions, please send an email to

Contact Us:

Center for Integrative Nanotechnology Sciences
2801 S. University Ave NANO Building
Little Rock , AR   72204
Office: 501.683.7456
Fax: 501.683.7601
Find out more!
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