JEOL 7000F SEM Field Emission Gun

Instrument Specifications

  • Magnification x 10 to 650,000
  • Resolution 1.2 nm at (30kV)
  • 3.0 nm (at 1.0 kV)
  • BEI detector (for backscattered electron image)
  • EDS (X-ray spectrometer) by EDAX
  • e-beam lithography by JC Nabity

Go to the Manuals page to download the SEM Basic Operating Instructions and JEOL 7000 Specimen Exchange Instructions

Note: Page is password protected. Users need to contact center staff to obtain it.